The Bend and Free Recovery (BFR) method is applied for measuring the active Af temperature of NiTi devices.
- Accurate method for all geometries → no limitations for sensitive parts
- Self-developed in-house and optimized for accurate measurements
- Non-destructive method for verifying the real transformation behavior
- Computer-assisted, fully automatic temperature cycling
- Printed graph including the Af temperature determined
Please see also DSC below